openPR Logo
Press release

XJTAG releases boundary scan for Teradyne TestStation

10-24-2014 06:47 PM CET | IT, New Media & Software

Press release from: XJTAG

XJTAG releases boundary scan for Teradyne TestStation

XJTAG releases boundary scan for Teradyne TestStation

Cambridge, UK, 21 October 2014 — XJTAG, a world leading supplier of boundary scan technology, today announced the release of the XJLink2-CFM and XJLink2-CFMx. The new modules provide Teradyne users with integrated access to XJTAG’s powerful test and programming tools, operating under the control of the TestStation™ test program.

With a JTAG solution installed internally to the TestStation In-Circuit Test System, the complexity and recurring cost impact of fixture-based test can be significantly reduced, while improving overall test coverage.

Integrated Teradyne access will provide you with the following:

- Advanced JTAG control using available slots on a Teradyne Multi-Function Application Board
- Use of the same tests in production line ICT and bench-top repair
- In-system programming of Flash, FPGA and CPLD devices
- Multi-protocol support – including SPI, I²C

This new integrated product enables streamlining of the production line, while also boosting fault coverage, thanks to the combination of XJTAG’s advanced connection test and non-JTAG device testing/programming with Teradyne’s In-Circuit Test capabilities.

The XJLink2-CFM is an advanced multi-TAP JTAG controller that fits into one of four Custom Function Module (CFM) locations on the Teradyne Multi-Function Application Board. A single or multiple XJLink2-CFMs can be added to the same Teradyne card for supplementary test and program capabilities, for instance testing panels of boards. XJLink2-CFMx expander cards are also available to maximize available connectivity from an XJLink2-CFM controller, from a maximum of 8 fixture-connectable signals when just using the XJLink2-CFM, up to 18 signals by adding one, two or three XJLink2-CFMx cards.

The test interface of the XJLink2-CFM is completely configurable allowing support for almost any programming protocol, not just JTAG devices. Programming speeds close to the theoretical maximum of a device can be achieved using the advanced features of the XJLink2-CFM.

The XJLink2-CFM is compatible with the standard USB XJLink2, so boards can be debugged at a repair station without having to develop a separate test setup. “Adding JTAG boundary scan functionality to the Teradyne test platform provides manufacturers with a robust, comprehensive test and programming environment,” says Simon Payne, CEO XJTAG.

Flexible licensing options also aid ease of use – the product can contain an XJTAG software license and allow standalone operation without additional dongles or network access. The system can also be licensed from a network server allowing the maximum use of XJTAG products without having to move licensed hardware between machines.

XJTAG offers a free trial and board setup to new users who are interested in taking an evaluation. Additional details can be found at www.xjtag.com.

About XJTAG (www.xjtag.com)

XJTAG is a worldwide leading supplier of IEEE Std. 1149.x compliant boundary scan tools, which focuses on innovative product development and high quality technical support. The company has its headquarters in Cambridge, UK and works closely with over 50 experienced and professional distributors and technology partners across the globe. XJTAG delivers a diverse range of boundary scan test solutions for clients across a wide range of industries, including aerospace, automotive, defence, medical, manufacturing, networking, and telecommunications.

About Teradyne (www.teradyne.com)

Teradyne (NYSE:TER) is a leading supplier of Automatic Test Equipment used to test semiconductors, wireless products, data storage and complex electronic systems which serve consumer, communications, industrial and government customers. In 2013, Teradyne had sales of $1.43 billion and currently employs approximately 3,800 people worldwide. Teradyne (R) is a registered trademark of Teradyne, Inc. in the U.S. and other countries. The company's divisions, Semiconductor Test Division, System Test Group, and Wireless Test are organized by the products they develop and deliver.

XJTAG
St John's Innovation Centre
Cowley Road
Cambridge
CB4 0DS
United Kingdom
www.xjtag.com

UK Phone: +44 1223 223007
US Phone: +1 800 928 6038

Agnes Borszeki
press@xjtag.com

This release was published on openPR.

Permanent link to this press release:

Copy
Please set a link in the press area of your homepage to this press release on openPR. openPR disclaims liability for any content contained in this release.

You can edit or delete your press release XJTAG releases boundary scan for Teradyne TestStation here

News-ID: 297921 • Views:

More Releases from XJTAG

XJTAG DFT for Mentor Graphics PADS
XJTAG DFT for Mentor Graphics PADS
• New easy to use Design For Test (DFT) tool • Free to PADS Schematic Design users • Avoid costly re-spins by catching errors at the design stage • Find errors in the JTAG chain(s) and repair them before producing any hardware • Harness the full power of boundary scan to improve testability CAMBRIDGE, UK, March, 2017 – Developed by XJTAG®, the free software for PADS® Schematic Design will significantly increase the Design for Test
XJTAG Delivers Fast ISP Flash Configuration for ARM-Based FPGA SoCs
XJTAG Delivers Fast ISP Flash Configuration for ARM-Based FPGA SoCs
Key Points: • XJFlash now supports In-System Programming of Xilinx Zynq, Altera Cyclone V SoC and other Dual ARM Cortex-A9 based FPGA SoCs • Experience up to 20 times faster Flash programming cycles through a single JTAG port • Delivers programming times better than or comparable to Ethernet/SD Card based solutions without the need for any additional hardware • Significantly increases throughput at the production stage • Can be fully integrated with 3rd Party Test Executives CAMBRIDGE, England, 4 Oct 2016

More Releases for JTAG

JTAG Boundary-Scan Hardware Global Market 2018 Top Key Players – JTAG Technolo …
Global JTAG Boundary-Scan Hardware Market WiseGuyRerports.com Presents “Global JTAG Boundary-Scan Hardware Market 2018 by Manufacturers, Regions, Type and Application, Forecast to 2023” New Document to its Studies Database. The Report Contain 123 Pages With Detailed Analysis. Description Boundary scan is a method for testing interconnects (wire lines) on printed circuit boards or sub-blocks inside an integrated circuit. Boundary scan is also widely used as a debugging method to watch integrated circuit pin states,
Corelis JTAG Tools Advance Manufacturing Test for Red Lion Controls
Complete ScanExpress JTAG/boundary-scan system reduces cost and improves production test time. Cerritos, CA, October 21, 2013 – Corelis, Inc., the leading supplier of high-performance boundary-scan test and measurement tools, announced the successful deployment of Corelis ScanExpress tools at Red Lion Controls for testing Human Machine Interface (HMI) products. The combination of ScanExpress boundary-scan and JTAG Embedded Test (JET) tools enabled rapid development of fast, non-intrusive structural and early functional tests for
Corelis JTAG Tools Extend Manufacturing Test Capability for IEC
Boundary-scan software enables quick, comprehensive test coverage for top manufacturer IEC Electronics. Cerritos, CA, June 5, 2012 – Corelis, Inc., the leading supplier of high-performance boundary-scan test and measurement tools, announced the integration of Corelis ScanExpress boundary-scan tools at IEC Electronics in Albuquerque, NM. The ScanExpress system adds non-intrusive JTAG capabilities to IEC Electronics’ impressive test arsenal which already includes automated optical/x-ray inspection (AOI/AXI), in-circuit test (ICT), flying probe, and
Corelis Extends JTAG Embedded Testing to Freescale i.MX51
JTAG functional test solution for i.MX51 applications processors increases test coverage. Cerritos, CA, November 15, 2011 – Corelis, Inc., the leading supplier of high-performance JTAG test and measurement tools, announced today ScanExpress JET™ support for all members of the Freescale i.MX51 family of applications processors. ScanExpress JTAG Embedded Test (JET) provides at-speed testing of embedded processor-based electronic printed circuit boards and systems to detect, isolate, and diagnose structural and functional defects
Corelis Announces JTAG Embedded Testing for AMD Processors
Complete functional test solution for Athlon, Turion, and Opteron product families. Cerritos, CA, October 17, 2011 – Corelis, Inc., the leading supplier of high-performance JTAG test and measurement tools, announced today ScanExpress JET support for AMD embedded processors. Supported AMD processor families include Turion™ II Neo, Athlon™ II Neo, Opteron™ 4100, and Opteron™ Quad-Core (socket Fr5). These processors represent high-performance, low power processing for edge-of-enterprise markets including storage and telecommunications, as
GOEPEL electronic enables graphical JTAG/Boundary-Scan Project Development
At International Test Conference (ITC) 2011 in Anaheim, CA, GÖPEL electronic introduces a new graphical user interface (GUI) for the company’s JTAG/Boundary Scan software platform SYSTEM CASCON™. CASCON Mission Assist™ enables completely graphical project development based on predefined mission targets, while automating the context sensitive adaptation of all system tools and process controls. Intuitive system controls guide first-time users safely through the project development flow and improve their productivity. The open